AES-4TH Testing System
AES-4TH Testing Sytstem provide a controllable environment with adjustable temperature, humidity, light, pressure, and gas condition, which can be used in the testing of sensors, detectors, transistors, and electrochemical devices.
1. Feature
01) Controllable temperature and humidity
02) 4+1 probes
03) High magnification
2. Specifications
01) Testing of sensors, detectors, transistors, and electrochemical devices
02) Quartz window: Φ 100 mm
03) Temperature range: -5~80 °C,precision: 1 °C, <1 °C when balance
04) RH range: 1%~90% RH, precision 2% RH, <±1.5% RH when balance
05) Position control: X: 20 mm, Y: 5 mm; Z: 5 mm, 4+1 probes
06) magnification: >10 cm, 10 μm
07) Sub-gate probes for FET testing
08) Shockproof: 9~30 Hz
04) Size: 1000 mm × 10000 mm × 500mm
3. Photographs